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Re: A New Triple-DES Key Wrap Algorithm

1999-02-10 09:18:07

Gents,

     Just a minor side observation;
     
     Yes, zero is easy to get right in a standard; but not as easy
 to TEST if an implementation is correct during debug stage...
a fixed non-symmetric pattern detects early-on big-endian vrs little-endian
problems and other such problems encountered by developers.
However, other tests nail that down as well, so no big deal.

This is not a request for a change, just a side-observation.

Brian Snow

 ----------
From: Carl Ellison
To: Russ Housley
Cc: Bob Jueneman; ietf-smime; cme; berson; bschanni; kent; pcain; mhetzel; 
brickell; djohnson; schneier; daw; denning; smid; omura; carlisle.adams; 
paulv; Blake.greenlee; benaloh; bfox; cjwagne; jis; TACAR.PRV-7.PROVO; 
merkle; BSnow; burt; ekr; jlinn; ams; rivest; balenson; denny; acc; jhs; 
dickie; smatyas; desmedt
Subject: Re: A New Triple-DES Key Wrap Algorithm
Date: Tuesday, February 09, 1999 11:26PM

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At 11:31 AM 2/9/99 -0500, Russ Housley wrote:
[RH] Two different IVs is easy.  The zero IVs were suggested by Carl
Ellison.

That's because one constant IV is as good as another, IMHO, and zero is a
lot easier to get right in a standard.


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+------------------------------------------------------------------+
|Carl M. Ellison         cme(_at_)acm(_dot_)org     http://www.pobox.com/~cme |
|    PGP: 08FF BA05 599B 49D2  23C6 6FFD 36BA D342                 |
+--Officer, officer, arrest that man. He's whistling a dirty song.-+